Optical Surface Profilometry (OSP) - NanoFocus®
The NanoFocus usurf® surface measurement system is a non-contact optical profiler that combines confocal technology with accurate precision motion to measure surfaces down to 2 nm vertical resolution. The NanoFocus µsurf® is the only non-destructive measuring system that provides this high level of correlation for non contact characterization of complex surface structures. Visit the NanoFocus website for more information.
The NanoFocus usurf® surface measurement system rapidly measures texture on a variety of materials, e.g. plastic, glass, metal, and ceramics. A selection of magnification optics provides single fields of view of 1600 um down to 280 um. Automated stage-stitching capability for assembling larger fields of view is possible.
The following are some of the analysis capabilities:
- Automatic calculation of surface parameters.
- User Selectable topgraphy plots, histogram plot, 3D interactive plots, and 2D analysis.
- Specialized features such as volume and Fourier decomposition enhance data analysis.
- Trim, edit, and select subsections of data with masking routines.
- Invert, rotate, and expand three-dimensional plots to emphasize relevant features.
- Display different data sets simultaneously for easy visual comparison.
