Summary of Instruments
Glow Discharge Optical Emission Spectroscopy (GD-OES) - LECO®
3/4 meter research optical emission spectrometer configured for Quantitative Depth Profiling (QDP). Outfitted with forty-one elemental channels. Standard Methods available for electrogalvanize, hot-dip galvanize/galvanneal and tinplate coatings; custom method development for customer specific applications.
Fourier Transform Infrared Spectroscopy (FT-IR) - Nicolet®
Optical bench with DTGS and research microscope with MCT detectors. Bench accessories include 80o grazing angle attachment, DRIFTS attachment and a variety of sample windows. Nic-Plan™ microscope has a 15X IR lens with ATR in both ZnSe and Ge. Most forms of data generation are available to include reflectance and transmittance. Commercial spectral libraries are available; custom library development for customer specific applications including on-line searching.
Optical Surface Profilometry (OSP) - NanoFocus®
Non-contact optical surface profiler system employing confocal technology with 2 nm vertical resolution. A selection of magnifications providing single fields of view of 1600 um down to 280 um with automated stage-stitching capability for assembling larger fields of view is possible. Standard analysis packages including surface roughness parameters, bearing ratio curve, Fourier transform, and volume.
Laser Scanning Profilometry (LSP) - NanoFocus®
Non-contact profilometer system employing a confocal point sensor with a 0.02 um vertical resolution and a 1 um resolution X-Y stage. Standard analysis package includes profile dimensions, roughness and X-Y-Z coordinate output.
X-Ray Diffraction (XRD) - Scintag®
X-ray spectrometer setup to perform polycrystalline x-ray diffraction, crystallographic texture determination, and residual stress measurement. System configured with a chromium or copper x-ray tube with a germanium detector. Library of 30,000 inorganic and 12,000 organic diffraction patterns available.
Image Analysis (IA) - Olympus PMG3
Inverted research microscope with 50X to 1000X magnification, auto-focus, and motorized stage (± 1μm positioning resolution) integrated to a LECO® acquisition and analysis system containing standard binary image processing and stereological measurement parameters.
Other
Twin Analytical has many instruments that are used to help characterize/prepare test samples in an investigation. For example, a microtome may be used to cut a through-and-through cross-section prior to doing SEM work.