Crystallographic Characterization
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Using a PTS X-ray Diffraction System
X-ray diffraction employs Bragg's law to determine atom lattice spacing within crystalline solids. The lattice spacing is unique to the substance analyzed and can be used to identify an unknown material, characterize the preferred orientation of the crystalline planes in a formed part, or measure the magnitude of the residual stresses remaining in a part after heat treatment or machining.
Example Solutions
The following are typical applications that the PTS system can be used for in product development, contamination identification, and process characterization.
- Crystallographic Texture Determination (Preferred Orientation)
- Residual Stress Measurement
- Retained Austenite Measurements
- Qualitative Phase Determination in a Mixture
- Identification of Metallurgical corrosion products
- Foreign material in various manufactured products
- Relative crystallinity of plastics
- Intensity data for a variety of materials
